发明名称 |
Self adjusting process for forming field effect transistors comprises a multiple step process in which a low ohmic connection metallization is finally applied to the source, drain and gate |
摘要 |
Self adjusting process for forming field effect transistors comprises establishing the outer limit of a source and drain region on a substrate (1) using mesa etching, by depositing a dielectric layer (2) and self-adjusting removal of the layer from the mesa; forming a dummy gate (4) on the mesa to define a gate; laterally separating metal implants (5), contact implants (6) and gate (12) by shrink etching the dummy gate; inserting an implant in the source and drain region and producing a silicide; planarizing up to the upper surface of the dummy gate; etching the gate and inserting the gate; and applying a low ohmic connection metallization to the source, drain and gate. Preferred Features: The gate is a Schottky, MOS, MIS, MES or junction gate. The dielectric layer is made from a thermal oxide.
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申请公布号 |
DE10053671(A1) |
申请公布日期 |
2002.05.08 |
申请号 |
DE20001053671 |
申请日期 |
2000.10.28 |
申请人 |
DAIMLERCHRYSLER AG |
发明人 |
BEHAMMER, DAG;ZEUNER, MARCO |
分类号 |
H01L21/336;H01L21/337;H01L21/338;H01L29/49;H01L29/78;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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