发明名称 OPTICAL OBSERVATION MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide an optical observation microscope which can be connected to a semiconductor-related device, is simple, small-sized, and low-priced, and can easily be moved. SOLUTION: This microscope is equipped with a housing K which has its housing width WID less than twice as large as the diameter of a wafer W as a body to be inspected and its housing depth DEP based upon the depth d1 of a load port LP of the semiconductor-related device D and optical observation heads L1, L2, and CCD provided in the housing K. The housing K has a part CNC connected to a connection part of the load port LP of the semiconductor-related device D, and there is not space filter between objective systems L1 and L2 in the optical observation heads and the wafer W, and the housing K is movable.
申请公布号 JP2002116384(A) 申请公布日期 2002.04.19
申请号 JP20000306300 申请日期 2000.10.05
申请人 NEC CORP;NIKON CORP 发明人 NAKAMURA TOYOKAZU;SHIMIZU FUSAO
分类号 G02B21/24;(IPC1-7):G02B21/24 主分类号 G02B21/24
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