发明名称 Method of forming overmolded chip scale package and resulting product
摘要 A method for forming a semiconductor device includes forming a conductive bump on one or more of bond pads of a semiconductor substrate of a semiconductor wafer. A top or uppermost portion of each conductive bump is then planarized. The exposed portions of an active surface of the semiconductor wafer are filled with a layer of encapsulation material. The conductive bumps are reformed to their preplanarized shape and the semiconductor wafer is then diced to form singulated semiconductor dice. A preferred method of the invention also includes placing each singulated die in a mold to complete a second encapsulation step wherein a layer of encapsulation material is formed on the back surface or, alternatively, on the back and side surfaces of the semiconductor die in order to encapsulate the back, or the back and sides, of the semiconductor die.
申请公布号 US2002025667(A1) 申请公布日期 2002.02.28
申请号 US20010982748 申请日期 2001.10.18
申请人 FARNWORTH WARREN M. 发明人 FARNWORTH WARREN M.
分类号 H01L21/56;H01L21/60;H01L23/31;H01L23/495;H01L29/06;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 H01L21/56
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