发明名称 Solid state imaging device and method for manufacturing the same
摘要 A charge storing layer of a photodiode having an N-type conductivity includes an N+-type additional implant area in the vicinity of a junction between the charge storing layer and an isolation region. The additional implant area provides an increase of stored charge and suppression of increase of the pulse voltage for a substrate shutter, and can be made to have a smaller width within a current design rule.
申请公布号 US6346722(B1) 申请公布日期 2002.02.12
申请号 US19990340127 申请日期 1999.06.28
申请人 NEC CORPORATION 发明人 KAWAKAMI YUKIYA;TANABE AKIHITO;MUTOH NOBUHIKO
分类号 H01L27/148;(IPC1-7):H01L27/148 主分类号 H01L27/148
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