CONTACT PROBE AND ITS MANUFACTURING METHOD

摘要

PROBLEM TO BE SOLVED: To obtain a contact operation with high accuracy even in an IC chip or the like which is provided with high-accuracy bent contact pins and staggered or offset electrode pads in a contact probe and its manufacturing method. SOLUTION: In the contact probe 10, a plurality of pattern interconnections 12 are formed on the surface of a film 11, and respective tips of the pattern interconnections are arranged in a protruding state from the film so as to be used as the contact pins 12. A hole part 11c or a slit part which is arranged in the base end part of every contact pin is formed. Every contact pin is bent while the hole part of the slit part is used as a starting point.