发明名称 COMPOSITE TESTER OF PERSONAL COMPUTER
摘要 PROBLEM TO BE SOLVED: To provide a composite tester of a personal computer capable of performing an overload inspection of the personal computer in a short time and to be easily handled. SOLUTION: Four DMA controllers are mounted on one printed board module (DD) 20 attachable/detachable to/from a vacant slot of the personal computer. A CPU 10 is successively interrupted at prescribed intervals by each DMA controller and write/read of bit pattern to/from a main memory 12 are performed. The bit pattern written in the main memory 12 is compared with the read bit pattern and inspection data whether or not the bit patterns coincide is acquired. Thus, an inspection equivalent to the one by operating four printed board modules is enabled and the inspection becomes a reliability inspection such as a memory overload inspection.
申请公布号 JP2002024100(A) 申请公布日期 2002.01.25
申请号 JP20000211289 申请日期 2000.07.12
申请人 MTT CORP 发明人 TAWARA TAKESHI
分类号 G06F12/16;(IPC1-7):G06F12/16 主分类号 G06F12/16
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