发明名称 DIVIDING METHOD OF WAFER, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To make it possible to handle a wafer and divided semiconductor chips with good reliability when the wafer is divided, and to greatly increase the number of chips taken from the wafer. SOLUTION: A plurality of aluminum pads 2 and a passivation film 3 are formed on a silicon substrate 1 with circular outline. A resist 4 formed on the silicon substrate 1 is patterned. Trench holes 5 as ditches for dividing the wafer are formed by dry etching in the silicon substrate 1 with the resist 4 as a mask. After the resist 4 is removed, a back grinding tape 6 is put on the side of the aluminum pad 2 of the silicon substrate 1, and the rear of the silicon substrate 1 is ground and polished until it reaches the trench hole 5. In this way, the separation width of the semiconductor chip in the wafer can be made small, and the layout of semiconductor devices on the wafer can be carried out without consideration on the chipping by dicing.
申请公布号 JP2002025948(A) 申请公布日期 2002.01.25
申请号 JP20000209093 申请日期 2000.07.10
申请人 CANON INC 发明人 MIYAGAWA MASASHI;SUZUKI YOSHIAKI
分类号 H01L21/304;H01L21/301;(IPC1-7):H01L21/301 主分类号 H01L21/304
代理机构 代理人
主权项
地址