发明名称 METHOD OF INTEGRATING SUBSTRATE CONTACT ON SOI WAFERS WITH STI PROCESS
摘要 A method for forming a substrate contact in a substrate that includes a silicon on insulator region. A shallow isolation trench is formed in the silicon on insulator substrate. The shallow isolation trench is filled. Photoresist is deposited on the substrate. A contact trench is formed in the substrate through the filled shallow isolation trench, silicon on insulator, and silicon substrate underlying the silicon on insulator region. The contact trench is filled, wherein the material filling the contact trench forms a contact to the silicon substrate.
申请公布号 SG85156(A1) 申请公布日期 2001.12.19
申请号 SG19990006334 申请日期 1999.12.10
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ATUL AJMERA;EFFENDI LEOBANDUNG;WERNER RAUSCH;DOMINIC J. SCHEPIS;GHAVAM G. SHAHIDI
分类号 H01L27/12;H01L21/74;H01L21/76;H01L21/762;H01L23/52;H01L23/58;H01L29/786;(IPC1-7):H01L21/74 主分类号 H01L27/12
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