发明名称 |
METHOD OF INTEGRATING SUBSTRATE CONTACT ON SOI WAFERS WITH STI PROCESS |
摘要 |
A method for forming a substrate contact in a substrate that includes a silicon on insulator region. A shallow isolation trench is formed in the silicon on insulator substrate. The shallow isolation trench is filled. Photoresist is deposited on the substrate. A contact trench is formed in the substrate through the filled shallow isolation trench, silicon on insulator, and silicon substrate underlying the silicon on insulator region. The contact trench is filled, wherein the material filling the contact trench forms a contact to the silicon substrate. |
申请公布号 |
SG85156(A1) |
申请公布日期 |
2001.12.19 |
申请号 |
SG19990006334 |
申请日期 |
1999.12.10 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ATUL AJMERA;EFFENDI LEOBANDUNG;WERNER RAUSCH;DOMINIC J. SCHEPIS;GHAVAM G. SHAHIDI |
分类号 |
H01L27/12;H01L21/74;H01L21/76;H01L21/762;H01L23/52;H01L23/58;H01L29/786;(IPC1-7):H01L21/74 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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