发明名称 |
Method for measuring transmittance of optical members for ultraviolent use, synthetic silica glass, and photolithography apparatus using the same |
摘要 |
A method is provided for evaluating a transmittance of an optical member for ultraviolet use, which is an object of measurement. The method includes the steps of cleaning the object of measurement, measuring a transmittance of the object of measurement within a predetermined time period from completion of the cleaning during which a rate of decrease in the transmittance of the object of measurement remains substantially constant, and correcting the transmittance measured in the step of measuring to a transmittance at an evaluation time arbitrarily selected within the predetermined time period in accordance with the constant rate of decrease in the transmittance and a time at which the transmittance is measured.
|
申请公布号 |
US6320661(B1) |
申请公布日期 |
2001.11.20 |
申请号 |
US20000538965 |
申请日期 |
2000.03.31 |
申请人 |
NIKON CORPORATION |
发明人 |
YOSHIDA AKIKO;KOMINE NORIO;JINBO HIROKI |
分类号 |
G01M11/00;G01N21/33;G01N21/59;G03F7/20;(IPC1-7):G01N21/00;G01J1/10;C03B37/075 |
主分类号 |
G01M11/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|