| 摘要 |
PURPOSE: An enhanced circular built-in self test(CBIST) circuit is provided, which generates a test pattern more randomly. CONSTITUTION: A CBIST circuit(200) includes n serially-connected CBIST cells(300_1-300_n) and a multiplexer(210). Signals being output from the CBIST cells are test patterns(TP1-TPn), and these test patterns are provided to a main assembly circuit(100). The multiplexer provides a signal(Sin) provided from the external as an input signal of the first CBIST cell(300_1) usually, but feeds back a signal being output from the last CBIST cell(300_n) as an input signal of the first CBIST cell during a BIST mode. That is, the multiplexer operates equally to a signature register by generating a feedback loop during the BIST mode.
|
