发明名称 Non-invasive brain function examination
摘要 <p>A brain function examining apparatus and others for performing an examination of a brain function by detecting a pupillary size of a subject's pupil are provided. The brain function examining apparatus includes a light source for illuminating the pupil, a pupillary detector for detecting the pupillary size, an index calculator for calculating, based on the pupillary size detected by the pupillary detector, a subject index indicative of a characteristic of the pupil, a database for storing a base index indicative of a characteristic of the pupil that can be used as reference, and an output unit for outputting the subject index, calculated by the index calculator, and the base index stored in the database. &lt;IMAGE&gt;</p>
申请公布号 EP1127534(A2) 申请公布日期 2001.08.29
申请号 EP20000122951 申请日期 2000.10.21
申请人 MATSUSHITA ELECTRIC WORKS, LTD. 发明人 SUZUKI, KENSHI;NAKAJIMA, RYOUJI;MURAKAMI, SHUJI;FUKUMOTO, ICHIRO;UCHIYAMA, HISASHI;FUKUSHIMA, SHOGO
分类号 A61B3/11;(IPC1-7):A61B3/11 主分类号 A61B3/11
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