发明名称 Active matrix substrate inspecting method, active matrix substrate, liquid crystal device, and electronic apparatus
摘要 The invention is a digital driver that enables an output terminal to be in a high-impedance condition for driving data lines, and an inspection circuit that is provided at ends of the data lines opposite to the digital driver. The inspection circuit includes bi-directional switches provided for each of the plurality of respective data lines, and a controller that controls the switching of the switches. By using the inspection circuit provided at the opposite ends of the data lines, inspections of data-line disconnection or digital-driver output can be performed as well as determining whether or not there is a point defect. In addition, since the circuit is designed only for inspection, its size is extremely small, and the circuit can be disposed in a dead space.
申请公布号 US6281700(B1) 申请公布日期 2001.08.28
申请号 US19980155310 申请日期 1998.09.25
申请人 SEIKO EPSON CORPORATION 发明人 MATSUEDA YOJIRO
分类号 G02F1/13;G02F1/133;G02F1/1339;G02F1/1362;G09F9/30;G09G3/00;G09G3/20;G09G3/36;H03M1/76;H03M1/80;H03M1/82;(IPC1-7):G01R31/00 主分类号 G02F1/13
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