发明名称 SUBSTRATE-PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To easily obtain temperature uniformity on a susceptor that is simple in structure, in a substrate processing apparatus. SOLUTION: In a substrate-processing apparatus, that has a susceptor 20 on which a substrate 16 to be processed is placed, and a panel heater 6 on which the susceptor is placed and which heats the susceptor and that processes a substrate by generating plasma under reduced pressure, the heat transfer rate in the thickness direction of the susceptor is made large in peripheral part and small in central part by forming a central empty space in the central part of the susceptor and a peripheral empty space, that is concentric with the central empty space, where the pressure of the gas enclosed in the peripheral empty space is higher than that in the central empty space.
申请公布号 JP2001217195(A) 申请公布日期 2001.08.10
申请号 JP20000027935 申请日期 2000.02.04
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 MAKIGUCHI KAZUMASA
分类号 H01L21/302;H01L21/205;H01L21/3065;H01L21/324;(IPC1-7):H01L21/205;H01L21/306 主分类号 H01L21/302
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