发明名称 METHOD FOR MANUFACTURING STENCIL MASKING
摘要 <p>PROBLEM TO BE SOLVED: To enhance production efficiency by developing a process for improving etching accuracy and shortening manufacturing process, in the manufacturing of a stencil masking which aims at reducing the influence of microloading effect in a dry etching production process in the manufacturing process, and to enhance the dimensional accuracy of in a masking face. SOLUTION: A stencil mask manufacturing process in the preceding back etching process includes forming gradations of a film thickness of a resist left in a pattern field, after developing by adjusting the amount of exposed light, and selectively thinning a masking substrate film in a minute pattern formation field, with an aspect ratio higher than that of the surrounding region, prior to patterning.</p>
申请公布号 JP2001210578(A) 申请公布日期 2001.08.03
申请号 JP20000017048 申请日期 2000.01.26
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 YOSHIDA AKIRA
分类号 H01L21/027;G03F1/20;(IPC1-7):H01L21/027;G03F1/16 主分类号 H01L21/027
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