| 摘要 |
A trench-type insulated gate bipolar transistor in which a channel stop region is partially formed between an n-type high-concentration emitter region and a p-type base region in which a conductive channel is to be formed. The channel stop region is doped with p-type impurities at high concentration. A portion of the emitter region directly contact the base region, and the other portion has the channel stop region disposed between itself and the base region without directly contacting the base region. At the portion where the channel stop region is interposed, an electron current from the emitter region does not flow vertically into a drift region, but horizontally moves to a direct contacts portion between the emitter region and the base region and then vertically flows to the drift region via the conductive channel. The horizontally-flowing electron current within the emitter region causes a voltage drop, thus reducing the voltage difference at the junction between the emitter region and the base region. Therefore, a latch-up phenomenon, in which a parasitic thyristor is turned on, is suppressed.
|
