发明名称 REPAIRING DEVICE OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A repairing device of a semiconductor memory device is provided to reduce the power of a laser used in cutting a fuse by reducing the width of a conductive material to prevent the damage of a device by the laser. CONSTITUTION: The repairing device includes a signal line, a precharging unit(100), an inverting/latching unit, first and second transistors(400,600), a fuse and a floating preventing unit(500). The precharging unit precharges a signal line to a logic "high". The inverting/latching unit outputs a control signal to select a normal cell or a redundant cell by inverting/latching a signal loaded to the signal line. The source-drain path of the first transistor is arranged between any node of the signal line and a ground power terminal of the signal line. The fuse is arranged between an address signal inputting terminal and a gate terminal of the first transistor. The second transistor turns the first transistor off when the fuse is cut, and an address signal is activated and inputted to the address signal inputting terminal. The floating preventing unit prevents the gate terminal of the first transistor from being floated when the fuse is cut and the address signal is inactivated.
申请公布号 KR20010061267(A) 申请公布日期 2001.07.07
申请号 KR19990063759 申请日期 1999.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GEUN GUK
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
代理机构 代理人
主权项
地址