发明名称 |
A method and an apparatus for testing supply connections |
摘要 |
<p>The invention presents an apparatus and method for testing supply connections (80) of an electronic device (10) by using a current mirror (20) configuration through using a particular connection of the branches of the current mirror to the supply line. Such connection results in unbalanced operation of the current mirror but depending whether said supply connection under test is proper or not, said unbalance is essentially different, resulting in a high sensitivity of the invented test device. <IMAGE></p> |
申请公布号 |
EP1107013(A2) |
申请公布日期 |
2001.06.13 |
申请号 |
EP20000870209 |
申请日期 |
2000.09.22 |
申请人 |
INTERUNIVERSITAIR MICRO-ELEKTRONICA CENTRUM;KATHOLIEKE HOGESCHOOL BRUGGE-OOSTENDE |
发明人 |
MANHAEVE, HANS;KERCKENAERE, STEFAAN |
分类号 |
G01R31/40;G01R31/04;G01R31/28;G01R31/30;(IPC1-7):G01R31/316 |
主分类号 |
G01R31/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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