发明名称
摘要 PURPOSE:To conduct reaction processing of a minute pattern all over a substrate uniformly and at high accuracy. CONSTITUTION:A reaction chamber 1 is provided with a substrate-temperature controlling plate 3 on which a substrate 5 is mounted and which can controls the temperature of the substrate and has an inlet 7 for introducing reactive gas in the chamber 1. A plate member 8 is provided between the substrate 5 and the inlet 7. The plate member 8 has a portion guiding the reactive compound 10 to the surface of the substrate 5, and has a shielding portion which prevent direct supply of the reactive compound 10 to the substrate 5.
申请公布号 JP3175276(B2) 申请公布日期 2001.06.11
申请号 JP19920077519 申请日期 1992.03.31
申请人 发明人
分类号 H01L21/027;G03F7/38;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
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