| 摘要 |
A method for capturing and directly scanning a rectilinear imaging element using a non-linear scan is incorporated into a single chip comprising at least a sensor array and an MSD. The method directly addresses each picture element of an analog image captured with an imaging device having either a partial spherical field of view or a conventional two-dimensional field of view. An image transform processor is used to process the captured image depending upon the particular portion of interest of the image. In the case of a non-linear scan, the image transform processor is provided with the capability of geometrically filtering the portion of interest of the captured image such that a two-dimensional, undistorted image is displayed at the monitor. A CMOS active pixel image sensor (APS) or Charge Injection Diode (CID) camera array are used to capture the image to be scanned. The image transform processor of the present invention is a Mixed-signal Semiconductor Device (MSD). The image transform processor corrects any predetermined distortion introduced by the image sensor array.
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