发明名称 DEFECT INSPECTING METHOD, DEFECT INSPECTING DEVICE, SIGNAL RECORDING AND REPRODUCING DEVICE, AND SIGNAL RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To attain the detection of a defective area without using an ECC etc. SOLUTION: The defect inspecting device is furnished with a head 1 and an amplifier part 2 for writing a dummy signal into a disk 100 and reading out the dummy signal recorded on the disk 100, a signal processing part 3 having the automatic gain control function for controlling the output level of the read out reproduction signal to be constant based on a gain control signal, and a microcomputer 5 provided with functions such as the dropout detecting function for monitoring the gain control signal outputted by the automatic gain control function of the signal processing part 3 to detect the dropout of the reproduced signal based on this gain control signal, the error position detecting function for outputting the error positional information in accordance with the detection result of the dropout detecting function, and the defect registering function for registering the defective area of the disk 100 based on the detection result of the dropout detecting function.
申请公布号 JP2001126201(A) 申请公布日期 2001.05.11
申请号 JP19990300144 申请日期 1999.10.21
申请人 SONY CORP;ALPS ELECTRIC CO LTD 发明人 SUGAWARA TAKAYUKI;KAWACHI TAKAHIRO;SUEMATSU TOSHINARI
分类号 G11B20/10;G11B5/00;G11B20/12;G11B20/18;(IPC1-7):G11B5/00 主分类号 G11B20/10
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