| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory provided with a defective column relieving circuit in which a redundant column can be used efficiently without increasing the chip area. SOLUTION: This device is provided with a replacement IO program circuit RIP1-RIPn corresponding to respectively memory blocks BK1-BKn coupling commonly to data buses DB1, DB2 of plural bits and one replacement address program circuit RAP for memory blocks of the prescribed numbers. The use mode of a redundant column for a memory block unit can be decided, while the number of program circuits can be reduced, and circuit occupied area is reduced. |
