发明名称 INTERFERENCE MEASUREMENT DEVICE AND METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To accurately evaluate optical performance such as an aberration of a measurement object such as a corner cube. SOLUTION: A measurement reflection unit 7 is put between a reference reflection unit 5 and a corner cube 6, and a double path system arrangement is formed. Light flux emitted from a laser 1 is transmitted through the reference reflection unit 5 and the corner cube 6 so as to be reflected on the measurement reflection unit 7, and then, returned to an interference meter main body via the corner cube 6 and the reference reflection unit 5 in this order. The phase of a boundary line image between the reflection face and the transmission face in the measurement unit 7 projected onto an observation face and the phase of a ridge line or a ridge line image of the corner cube 6 also projected onto the observation face are turned by an angle of about 30 degrees around the optical axis so as to be inspected.
申请公布号 JP2001091405(A) 申请公布日期 2001.04.06
申请号 JP19990273288 申请日期 1999.09.27
申请人 TOPCON CORP 发明人 NAGAHAMA HIROYUKI;MIHASHI TOSHIBUMI
分类号 G01B9/02;G01M11/02;(IPC1-7):G01M11/02 主分类号 G01B9/02
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