DEVICE OF TESTING VOLTAGE LEVEL

摘要

PURPOSE: A device of testing voltage level having a simple circuit structure is provided to test voltage level inside the semiconductor IC(Integrated Circuit) chip. CONSTITUTION: In a device testing the operation voltage(Vlcd) of a semiconductor IC(Integrated Circuit) chip driving an LCD panel, the first reference voltage generator(12) generates the first reference voltage(V1) corresponding to the maximum of the operation voltage(Vlcd). The first comparator(14) compares between the operation voltage(Vlcd) and the first reference voltage(V1). The second reference voltage generator(22) generates the second reference voltage(V2) corresponding to the minimum of the operation voltage(Vlcd). The second comparator(24) compares between the operation voltage(Vlcd) and the second reference voltage(V2)