发明名称 CMOS IMAGE SENSOR
摘要 <p>A CMOS image sensor is provided to stably transfer a signal by removing contact defects between a floating node and a gate pattern of a driving transistor. A photodiode(PD1,PD2) is formed in a substrate. A gate pattern(Tx1,Tx2) of a transfer transistor is formed on one surface of the photodiode. A gate pattern(Dx) of a driving transistor is separated from the gate pattern of the transfer transistor. A floating node comes in butting-contact with the gate pattern of the driving transistor by a contact plug, formed in a gap between the gate pattern of the transfer transistor and the gate pattern of the driving transistor.</p>
申请公布号 KR100690169(B1) 申请公布日期 2007.02.26
申请号 KR20050100741 申请日期 2005.10.25
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 PARK, DONG HYUK
分类号 H01L27/146;H04N5/335;H04N5/369;H04N5/374 主分类号 H01L27/146
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