发明名称 Method of making high performance MOSFET with polished gate and source/drain feature
摘要 A transistor and a method of making the same are provided. The method includes the steps of forming a gate dielectric stack on the substrate that has a gate dielectric layer and forming first and second sidewall spacers adjacent the gate dielectric stack. A first portion of the gate dielectric stack is removed while a second portion thereof is left in place. First and second source/drain regions are formed in the substrate, and a conductor layer is formed over the first and second source/drain regions and on the second portion of the gate dielectric stack. The gate dielectric may be composed of a high dielectric constant material with a thin equivalent thickness of oxide. The method enables integrated processing of the gate electrode and source/drain metallization.
申请公布号 US6174794(B1) 申请公布日期 2001.01.16
申请号 US19980137275 申请日期 1998.08.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GARDNER MARK I.;GILMER MARK C.
分类号 H01L21/28;H01L21/285;H01L21/336;H01L21/768;H01L29/51;(IPC1-7):H01L21/320 主分类号 H01L21/28
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