发明名称 DISPLACEMENT MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To realize displacement measurement of high precision to an object to be measured at a high speed in a short time, by constituting an imagery lens part in an array type along the scanning direction, in each of the specified number of condenser lens parts, and enlarging the scanning width of an irradiation point. SOLUTION: A light receiving means 6 comprises a condenser lens array C, an imagery lens array F and a photodetector group P. In the condenser lens array C, a plurality of condenser lens parts C1-Cn which have uniform imagery characteristics around an optical axis are constituted along the scanning direction of an irradiation light, and a measuring light is converged. In the imagery lens array F, a plurality of imagery lens parts F1-Fm which have uniform imagery characteristics around an optical axis are constituted in each of the specified number of condenser lens parts C1-(C6) along the scanning direction of the irradiation light, and a converged measuring light forms images on a light receiving surfaces P1a-Pma. The photodetector group P has photodetectors P1-Pm in each of the imagery lens parts F1-Fm.
申请公布号 JP2000304506(A) 申请公布日期 2000.11.02
申请号 JP19990112572 申请日期 1999.04.20
申请人 ANRITSU CORP 发明人 TAKAHASHI HIDEAKI;TASHIMO TAKAHISA;TANUMA ATSURO
分类号 G01B11/00;G01C3/06;G02B3/00;(IPC1-7):G01B11/00 主分类号 G01B11/00
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