发明名称 Dynamic type semiconductor memory device having function of compensating for threshold value
摘要 There is provided a dynamic type semiconductor memory device including (a) a first hierarchized complementary bit line, (b) a second hierarchized complementary bit line, (c) a first sense-amplifier electrically connected to the first bit line, (d) at least one second sense-amplifier electrically connected to both the first bit line and the second bit line, (e) a capacitor located between the first and second bit lines for each of second sense-amplifiers, and (f) a transfer gate arranged in series with the capacity between the first and second bit lines. The above-mentioned dynamic type semiconductor memory device makes it possible to store two-bit data in a single memory cell by employing a memory cell comprised of one transistor and one capacitor, without the use of a conventional memory cell having two transistors and one capacitor. Hence, the dynamic type semiconductor memory device ensures a significant reduction in a chip area.
申请公布号 US6130845(A) 申请公布日期 2000.10.10
申请号 US19980161954 申请日期 1998.09.29
申请人 NEC CORPORATION 发明人 OOTSUKI, TETSUYA;NARITAKE, ISAO
分类号 G11C11/401;G11C7/06;G11C7/18;G11C11/4091;G11C11/4097;G11C11/56;H01L21/8242;H01L27/108;(IPC1-7):G11C7/00 主分类号 G11C11/401
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