发明名称 |
METHOD FOR FABRICATING MOSFET OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a field effect transistor is to remove the short channel effect and at the same time to form a source and drain junction having a high concentration impurity. CONSTITUTION: A field oxide layer(20) is formed on a semiconductor substrate(10). A pad oxide layer is formed on the entire structure to prevent the semiconductor substrate from being stressed in an ion implantation process. A n+ ion implantation region(70) is formed by implanting nitrogen ions into the semiconductor substrate to be provided with a channel region and a source/drain region. After removing the pad oxide layer, a gate oxide layer(40) and a gate electrode polysilicon layer are formed on the entire structure. A gate electrode(50) is formed by an etching process using a gate electrode mask. A source region(80) and a drain region(90) having an LDD(lightly doped drain) structure are formed by implanting conductive impurity ions which are the opposite of the nitrogen into the semiconductor substrate.
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申请公布号 |
KR100265851(B1) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19960076267 |
申请日期 |
1996.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
HWANG, JUN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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