发明名称 METHOD FOR FABRICATING MOSFET OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a field effect transistor is to remove the short channel effect and at the same time to form a source and drain junction having a high concentration impurity. CONSTITUTION: A field oxide layer(20) is formed on a semiconductor substrate(10). A pad oxide layer is formed on the entire structure to prevent the semiconductor substrate from being stressed in an ion implantation process. A n+ ion implantation region(70) is formed by implanting nitrogen ions into the semiconductor substrate to be provided with a channel region and a source/drain region. After removing the pad oxide layer, a gate oxide layer(40) and a gate electrode polysilicon layer are formed on the entire structure. A gate electrode(50) is formed by an etching process using a gate electrode mask. A source region(80) and a drain region(90) having an LDD(lightly doped drain) structure are formed by implanting conductive impurity ions which are the opposite of the nitrogen into the semiconductor substrate.
申请公布号 KR100265851(B1) 申请公布日期 2000.09.15
申请号 KR19960076267 申请日期 1996.12.30
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 HWANG, JUN
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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