发明名称 |
Method and apparatus for monitoring CVD liquid source for forming thin film with high dielectric constant |
摘要 |
An object is to provide a method of monitoring a CVD liquid source for forming a thin film having a high dielectric constant, which allows detection of the concentration abnormality and the deterioration of the CVD liquid source. First, the CVD liquid source used as a sources of chemical vapor deposition is prepared by dissolving an organometallic compound of dipivaloyolmethane type in an organic solvent. Secondly, a spectroscopy of the CVD liquid source is performed.
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申请公布号 |
US6117482(A) |
申请公布日期 |
2000.09.12 |
申请号 |
US19980089491 |
申请日期 |
1998.06.02 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KAWAHARA, TAKAAKI;HORIKAWA, TSUYOSHI;TARUTANI, MASAYOSHI;YAMAMUKA, MIKIO |
分类号 |
G01N21/33;C23C16/18;C23C16/448;C23C16/52;H01L21/31;(IPC1-7):B05D5/12;C23C16/06 |
主分类号 |
G01N21/33 |
代理机构 |
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代理人 |
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