发明名称 Method and apparatus for monitoring CVD liquid source for forming thin film with high dielectric constant
摘要 An object is to provide a method of monitoring a CVD liquid source for forming a thin film having a high dielectric constant, which allows detection of the concentration abnormality and the deterioration of the CVD liquid source. First, the CVD liquid source used as a sources of chemical vapor deposition is prepared by dissolving an organometallic compound of dipivaloyolmethane type in an organic solvent. Secondly, a spectroscopy of the CVD liquid source is performed.
申请公布号 US6117482(A) 申请公布日期 2000.09.12
申请号 US19980089491 申请日期 1998.06.02
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KAWAHARA, TAKAAKI;HORIKAWA, TSUYOSHI;TARUTANI, MASAYOSHI;YAMAMUKA, MIKIO
分类号 G01N21/33;C23C16/18;C23C16/448;C23C16/52;H01L21/31;(IPC1-7):B05D5/12;C23C16/06 主分类号 G01N21/33
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