发明名称 RF powered plasma enhanced chemical vapor deposition reactor and methods
摘要 Plasma enhanced chemical vapor deposition (PECVD) reactors and methods of effecting the same are described. In a preferred implementation, a PECVD reactor includes a processing chamber having a first electrode therewithin. A second electrode is disposed within the chamber and is configured for supporting at least one semiconductor workpiece for processing. A first RF power source delivers RF power of a first frequency to the first electrode. A second RF power source delivers RF power of a second frequency to the second electrode. Preferably the first and second frequencies are different from one another, and even more preferably, the first frequency is greater than the second frequency. The preferred reactor includes a thermocouple which provides temperature information relative to one of the electrodes. According to a preferred implementation, the power loop developed by the first RF power source is grounded interiorly of the chamber in a manner which reduces if not eliminates interference with other reactor components including the thermocouple.
申请公布号 US6112697(A) 申请公布日期 2000.09.05
申请号 US19980026566 申请日期 1998.02.19
申请人 MICRON TECHNOLOGY, INC.;APPLIED MATERIALS, INC. 发明人 SHARAN, SUJIT;SANDHU, GURTEJ S.;SMITH, PAUL
分类号 C23C16/509;C23C16/505;H01J37/32;H01L21/205;H05H1/46;(IPC1-7):C23C16/00;H05H1/00 主分类号 C23C16/509
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