发明名称 METHOD FOR CORRECTING OPTICAL WAVE ABERRATION IN OPTICAL SYSTEM, AND OPTICAL SYSTEM AND MICROSCOPE MANUFACTURED BASED ON IT
摘要 PROBLEM TO BE SOLVED: To provide a method for correcting optical wave aberration in an optical system, and the optical system and a microscope manufactured based on this method. SOLUTION: In this method an optical wave surface for the various kinds of wavelength and visual fields between an entrance pupil EP and an exit pupil AP is calculated and phase difference existing according to circumstances is compensated by at least one surface 5 or 7 exerting an effect on phase in an optical path. Besides, this microscope is constituted so that the axial line A of the first reflector 3 thereof forms an angleαdeviated from the optical axis O and from 0 deg..
申请公布号 JP2000235151(A) 申请公布日期 2000.08.29
申请号 JP20000035981 申请日期 2000.02.14
申请人 LEICA GEOSYSTEMS AG 发明人 BERNHARD BRAUNECKER;MASSIMO BEAVER
分类号 G02B17/00;G02B17/08;G02B23/02;G02B27/00;(IPC1-7):G02B23/02 主分类号 G02B17/00
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