发明名称 SPOT-TYPE HIGH-INTENSITY X-RAY SOURCE
摘要 The present invention relates to X-ray sources having radiation areas with reduced effective dimensions. This invention can be used in X-ray microscopes, in microdefectoscopes as well as in X-ray tomographs. The device of the present invention includes an electron emitter (7), electronic focalisation lenses (9, 10) as well as a shooting-through anode (11), wherein said anode can be arranged in the window of the radiation source and may be provided with a cooling system (17). The electron beam is focused in the shape of a spot or a line behind the anode and along its trajectory. The iris (16) of the X-ray beam diaphragm (15) is provided at the focus of the electronic lens (10).
申请公布号 WO0049637(A1) 申请公布日期 2000.08.24
申请号 WO2000RU00035 申请日期 2000.02.04
申请人 QUANTA VISION, INC.;LAZAREV, PAVEL IVANOVICH;KOMARDIN, OLEG VALENTINOVICH 发明人 LAZAREV, PAVEL IVANOVICH;KOMARDIN, OLEG VALENTINOVICH
分类号 H01J35/04;H01J35/14;H01J35/18;H01J35/22;H05G1/02;H05G1/64;(IPC1-7):H01J35/08 主分类号 H01J35/04
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