发明名称 METHOD FOR DEVELOPING PHOTO MASKING AND APPARATUS THEREOF
摘要 PURPOSE: A method for developing a photo masking is provided which can obtain a uniform pattern on a wafer by dissolving a selected PR(photoresist) completely on the wafer. CONSTITUTION: A developing facility of a photo masking process includes: a spin chuck(20) having a turn table(22) on whose top a semiconductor wafer(40) where patterns are formed is placed; a part depositing a developer(44) on the top surface of the wafer placed on the turn table of the spin chuck; and a vibration generation part which is installed on the spin chuck to activate the developer deposited on the wafer by vibrating the spin chuck.
申请公布号 KR20000042115(A) 申请公布日期 2000.07.15
申请号 KR19980058205 申请日期 1998.12.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SANG JIN
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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