发明名称 HALL PROBE
摘要 PROBLEM TO BE SOLVED: To obtain a Hall probe in which the temperature of a Hall element sensor can be compensated with a simple constitution. SOLUTION: A Hall element sensor 3 which is arranged and installed at the tip of a substrate 2 is provided. In addition, a temperature compensating element 4 which is arranged and installed near the Hall element sesnor 3 on the substrate 2 and which is connected in series with the output side of the Hall element sensor 3 is provided. Then, the temperature compensating element 4 directly compensates the output voltage of the Hall element sensor 3, it is subjected to the nearly same temperature change as the Hall element sensor 3, and it can compensate the temperature of the Hall element sensor 3 satisfactorily.
申请公布号 JP2000171538(A) 申请公布日期 2000.06.23
申请号 JP19980348975 申请日期 1998.12.08
申请人 DENSHI JIKI KOGYO KK 发明人 AKAMATSU SATOSHI
分类号 H01L43/06;G01R33/07;(IPC1-7):G01R33/07 主分类号 H01L43/06
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