发明名称 METHOD AND APPARATUS FOR INSPECTION OF SCREEN
摘要 PROBLEM TO BE SOLVED: To obtain a method and an apparatus in which various defects existing on a display screen can be inspected at high speed and with high accuracy without constituting a complicated system by detecting a defect on the basis of the shade of a single composed shade image in which a plurality of shade signals in different exposure times are composed. SOLUTION: A light source 2 shines light at an object 1 to be inspected. The shade signal in every pixel of the object 1 to be inspected is obtained through a camera 3, and it is sent to a computer 4. The computer 4 controls the light source 2, and it controls the exposure time in the imaging operation of the camera 3. In the computer 4, an image memory 5 stores shade data in a form which corresponds to the row and the column of every pixel. In addition, in the computer 4, a program which executes a processing operation is set in a program memory 6. In Step 1, an image from the object to be inspected is fetched. In Step 2, shade images which are fetched in Step 1 are composed. In Step 3, a part which is changed from the neighborhood is detected with reference to the shade images obtained in Step 2.
申请公布号 JP2000162089(A) 申请公布日期 2000.06.16
申请号 JP19980334842 申请日期 1998.11.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YUGAWA NORIAKI;KOBAYASHI KOTARO
分类号 G01N21/88;G01M11/00;G06T1/00;G06T7/00 主分类号 G01N21/88
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