Verfahren zur Funktionsüberprüfung von Speicherzellen eines integrierten Speichers

摘要

A testing means (6) tests the function of storage cells (3) of a memory (10). A first group (1) of the storage cells (3) is tested and the corresponding test results are temporarily stored in a second group (2) of the storage cells (3) before the results are released outside the memory (10).