发明名称 WORD LINE DECODING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A word line decoding circuit is provided to attain high speed decoding operation without a loss in a layout area. CONSTITUTION: A word line decoding circuit includes a buffer section(10) having a plurality of buffers(B1-Bi), a first decoding section(20) having a plurality of first decoders(PD1-PDs), and a second decoding section(40) having a plurality of second decoders (MD1-MDk). The buffers(B1-Bi) temporarily store and output plural address signals(A1-Ai). The first decoders (PD1-PDs) pre decode the address signals(A1-Ai) offered from the buffers(B1-Bi). The second decoders(MD1-MDk) decode the output signals from the first decoders(PD1-PDs) and generate signals to activate word lines(WL1-WLk) when a control transistor(CT) operates in response to a pulse control signal(PCS). A source of the control transistor(CT) is grounded and a drain thereof is commonly connected to the second decoders(MD1-MDk). The word line decoding circuit reduces delay time in activating the word lines, so that high speed decoding operation is attained. Further, loss in layout area is prevented since the delay circuit inside the first decoders is not required.
申请公布号 KR20000031555(A) 申请公布日期 2000.06.05
申请号 KR19980047658 申请日期 1998.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN, HOE SEON;KWAK, CHUNG KEUN
分类号 G11C11/00;(IPC1-7):G11C11/00 主分类号 G11C11/00
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