| 摘要 |
PURPOSE: A dual test apparatus is provided to measure a precise current consumption to improve a test reliability by excluding an interference between two semiconductor chips of a wafer level. CONSTITUTION: The dual test apparatus comprises a first and a second semiconductor chip of wafer level combined commonly with a power supply line, a power section for supplying the power to the first and second semiconductor chip, a first switching section combined between the power section and the first semiconductor chip, a second switching section combined between the power and the second semiconductor chip, and a controller connecting the power with the first and the second chip electrically according to switching the first and the second switching section in normal mode and intercepting the power from the first and the second chip electrically according to switching selectively the first or the second switching section responding to an outer command in current measuring mode. |
