| 摘要 |
PROBLEM TO BE SOLVED: To test analog circuit blocks which are incorporated into an integrated circuit easily and swiftly. SOLUTION: When an LSI 37 is fitted to a test board 33, analog circuit blocks 39-42 which are incorporated into the LSI 37 are connected in concatenation through a wiring pattern 38 provided on a test board 33. An LSI tester 32 outputs a test signal from an analog signal generator 34 to an input terminal IN1, and tests the analog circuit blocks 39-42 collectively at a time, on the basis of this test signal and an output signal from an output terminal OUT4 detected by an analog signal inputting part 36.
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