首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Verfahren zum Bestimmen des Brechungsindex der obersten Dünnschicht einer mehrlagigen Schicht
摘要
申请公布号
DE3834948(C2)
申请公布日期
1999.11.11
申请号
DE19883834948
申请日期
1988.10.13
申请人
RICOH CO., LTD.
发明人
ISOBE, TAMI
分类号
G01N21/21;G01N21/41;(IPC1-7):G01N21/41;G01J3/447
主分类号
G01N21/21
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SUBSTITUTED BENZOYLCYCLOHEXENONES AND THEIR USE AS HERBICIDAL AGENTS
HIGH DENSITY LIPOPROTEIN-REACTIVE PEPTIDES
MOTOR OPERATED SNOW CHAIN SYSTEM
PROCESS FOR MAKING SILANOL STOPPED OLIGOMERIC MATERIALS
A REAL-WORLD REPRESENTATION SYSTEM AND LANGUAGE
PORTABLE MEDICAL GAS HUMIDIFIER
METHOD AND COMPOSITIONS FOR INHIBITING THROMBIN-INDUCED COAGULATION
Organic waste handling unit, comprises a movable frame, drive units, a space saving drive, and blade units
SAFETY LINE TRAVELLER AND SUPPORT
Activation of cationic transition metal catalyst, useful in e.g. metathesis, oligomerization reaction, involves using ionic liquid and compressed carbon dioxide
CONVERTIBLE WRITING INSTRUMENT
METHOD FOR MANUFACTURING A SANDWICH BUILDING ELEMENT
CUTTING TOOL WITH IMPROVED INSERT SEAT ARRANGEMENT FOR INDEXABLE CUTTING INSERTS
REFRACTORY ARTICLE HAVING A RESIN-BONDED LINER
VENEER-SLICING MACHINE
CARRIER-FREQUENCY SYNCHRONIZATION SYSTEM FOR IMPROVED AMPLITUDE MODULATION AND TELEVISION BROADCAST RECEPTION
LINEAR ACTUATOR, PARTICULARLY AN AIRCRAFT BRAKE ACTUATOR
SEMICONDUCTOR MEMORY TEST APPARATUS AND METHOD FOR ADDRESS GENERATION FOR DEFECT ANALYSIS
DEVICE USED TO PERFORM EXPONENTIATION CALCULATIONS APPLIED TO POINTS ON AN ELLIPTICAL CURVE
CONTACT DEVELOPMENT SYSTEM REFERENCE STRUCTURE