发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for forming stable crystalline on the phosphorus- doped amorphous silicon surface in a manufacture of a semiconductor device such as a DRAM, in particular a method for forming an HSG-Si electrode for a semiconductor device. SOLUTION: When a substrate has an amorphous silicon layer to which an impurity is added, this manufacturer of a semiconductor device has a process of removing a natural oxide film on the surface of the amorphous silicon layer, a process of applying heat treatment to the substrate, a process of exposing the substrate to a silicon compound gas under a certain partial pressure, and a process of applying heat treatment to the substrate in a non-oxidizing gas atmosphere. At this time, prior to the process of removing a natural oxide film from the amorphous silicon layer surface, this manufacturing method, for a semiconductor device has a process of dipping the substrate in pure water.
申请公布号 JPH11274097(A) 申请公布日期 1999.10.08
申请号 JP19980072038 申请日期 1998.03.20
申请人 SONY CORP 发明人 SAITO MASAKI
分类号 H01L27/04;H01L21/205;H01L21/28;H01L21/822;H01L21/8242;H01L27/108 主分类号 H01L27/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利