发明名称 |
POSITION MEASUREMENT METHOD AND EXPOSURE METHOD USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To reduce influence of low frequency noise and system noise by carrying out coordination so that the sum of the distance between a reference pattern and a measurement signal selected from a pattern of a measurement signal gets an extreme value by a time normalization matching method. SOLUTION: The number of data constituting a reference pattern is J (J is an integer exceeding 2) and continuous I (I is an integer exceeding 2) data are extracted from the (p)th ((p) is an integer exceeding 1) data in a pattern of a measurement signal thereof. I data extracted from a measurement signal pattern from detection objects 22X, 24X are coordinated to J data constituting the reference pattern. The distance is obtained for each pair of the coordinated data and coordination is performed for J data and I data so that the sum of a distance of J pairs or I pairs gets an extreme value. The position of the detection objects 22X, 24X is obtained from a value of (p) whereat the sum of the distance gets a maximum value and a minimum value. |
申请公布号 |
JPH11214289(A) |
申请公布日期 |
1999.08.06 |
申请号 |
JP19980017223 |
申请日期 |
1998.01.29 |
申请人 |
NIKON CORP |
发明人 |
NAKAJIMA SHINICHI;YOSHIDA KOJI |
分类号 |
G01B11/00;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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