发明名称 PHOTOMASK WRITING SYSTEM AND METHOD THEREFOR
摘要 <p>PROBLEM TO BE SOLVED: To provide a photomask writing system capable of attaining optimum dimensional accuracy in a stage where a photomask is used by deciding a scale value considering the difference of temperature and humidity between environment where the photomask is written and environment where the photomask is actually used. SOLUTION: Attribute information showing a used stage is added to writing data registered in a data input part 1. The temperature and the humidity in a writing chamber and the stage where the photomask is used are read from a parameter storage part 7 so as to calculate an optimum scale factor in a scale factor arithmetic operation part 2. Furthermore, the writing data is multiplied by the scale factor calculated in the arithmetic operation part 2 by a writing data scale correction part 3. The writing data is converted in terms of format by a data processing part 4 and supplied to a writing mechanical control part 5. Under the control of the control part 5, the photomask having the optimum dimension accuracy is written by a writing machine part 6.</p>
申请公布号 JPH11143051(A) 申请公布日期 1999.05.28
申请号 JP19970310189 申请日期 1997.11.12
申请人 NEC CORP 发明人 HAYASHIDA NORIFUMI
分类号 G03F1/68;G03F1/70;G06T1/00;H05K3/00;(IPC1-7):G03F1/08 主分类号 G03F1/68
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