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经营范围
发明名称
SCAN TESTING CIRCUIT
摘要
申请公布号
JPH1123661(A)
申请公布日期
1999.01.29
申请号
JP19970174746
申请日期
1997.06.30
申请人
NEC CORP
发明人
OGAWA TADAHIKO
分类号
G01R31/28;H03K19/00;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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