| 摘要 |
PROBLEM TO BE SOLVED: To enable a boundary scan inspection device to execute boundary scan inspection using inexpensive constitution without having a boundary scan test vector generating function. SOLUTION: A boundary scan inspection device 1 receives a boundary scan test vector produced by a separate test vector generating device 8, originates test execution data by means of a test execution data originating part 3 based on the test vector and according to requirements for boundary scan inspection, sets the inspection requirements by means of an inspection requirement setting part 4, and executes boundary scan inspection by means of a tent executing part 2 based on the test execution data. Circuit information about the circuit part to be inspected in a circuit 5 which is the subject of boundary scan inspection, and expectation data, both of which are required to specify the contents and places of defects by executing the boundary scan inspection, are originated by an analysis data generating part 61 from a comment part added to the boundary scan test vector. |
