发明名称 A capacitor and method for making a capacitor
摘要 <p>The present invention provides a semiconductor device having a capacitor that is formed through: a first step of forming a polysilicon layer having a rough surface after a nonconductive layer is applied to a base substrate; a second step of etching back away the polysilicon layer to expose the nonconductive layer and thus remaining islandlike polysilicon layers; a third step of etching the nonconductive layer, using the remained polysilicon layers as an etching mask; a fourth step of etching the base substrate of the capacitor, using the nonconductive layer as a mask; a fifth step of forming a pattern of the base substrate of the capacitor after the removal of the remained nonconductive layer; a sixth step of forming an upper substrate of the capacitor after the formation of a dielectric film of the capacitor. According to this invention, the surface area of the capacitor electrode is remarkably enhanced such that the integrity of DRAMs is more improved. &lt;IMAGE&gt;</p>
申请公布号 EP0867927(A2) 申请公布日期 1998.09.30
申请号 EP19980201423 申请日期 1992.11.17
申请人 SAMSUNG ELECTRONICS CO. LTD. 发明人 KO, JAEHONG;KIM, SUNGTAE;SHIN, HYUNBO;KANG, SEONGHUN
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;H01L29/94;(IPC1-7):H01L21/320 主分类号 H01L27/04
代理机构 代理人
主权项
地址