发明名称 SKIN IMPEDANCE MEASUREMENT METHOD AND SKIN IMPEDANCE MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To accurately output control signals to the device of a game or the like in real time without being affected by the individual difference and daily deviation of the measured result of skin impedance and disturbance. SOLUTION: In a threshold value calculation processing, a CPU reads SIR signals from a skin impedance measurement part as the measured value SIRnew of this time (s22) after performing initialization (s21), performs the elimination processing of pulse noise by using the measured values of the previous three times including the measured value SIRnew of this time (s23 and s24), stores the maximum value SIRmax of the measured value in an updating manner when the measured value is changed exceeding the maximum value until then, gradually reduces the stored maximum value SIRmax of the measured value in a state where large change does not appear in skin impedance signals and sets a threshold value TH within the range of the maximum value SIRmax of the measured value and a movement average value AVE (n26-n30).
申请公布号 JPH10254613(A) 申请公布日期 1998.09.25
申请号 JP19970051585 申请日期 1997.03.06
申请人 OMRON CORP 发明人 SHIKI NAOHITO
分类号 A61B5/05;G06F3/01;G06F3/033 主分类号 A61B5/05
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