发明名称 |
Method for detecting displacement of atoms on material surface and method for local supply of heteroatoms |
摘要 |
Atomic displacement on a material surface is detected by, in a system comprising the tip of a scanning tunneling microscope (STM) and a material in question, upon an atomic displacement operation comprising extraction of atoms on the material surface and adsorption of atoms onto the material surface through application of a pulse voltage to the tip of STM, measuring a z-piezo voltage along the time series during and after application of the pulse voltage. Furthermore, heteroatoms dissociated by a reaction between the tip surface of STM and heteromolecules in a heteromolecular atmosphere are stored on the surface of the tip of STM, and then, heteroatoms are locally adsorbed onto the material surface by causing electro-evaporation of the heteroatoms through application of a prescribed scanning voltage to the tip of STM.
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申请公布号 |
US5808311(A) |
申请公布日期 |
1998.09.15 |
申请号 |
US19950491484 |
申请日期 |
1995.06.16 |
申请人 |
RESEARCH DEVELOPMENT CORPORATION OF JAPAN |
发明人 |
AONO, MASAKAZU;GREY, FRANCOIS;KOBAYASHI, ATARU;SNYDER, ERIC;UCHIDA, HIRONAGA;HUANG, DEHUAN;KURAMOCHI, HIROMI |
分类号 |
B82B3/00;G01B7/00;G01B7/34;H01J37/30;(IPC1-7):H01J37/30 |
主分类号 |
B82B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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