发明名称 |
Thin film transistor for antistatic circuit and method for fabricating the same |
摘要 |
A thin film transistor for an antistatic circuit includes: wells formed on a silicon substrate; insulating layers for electrical isolation between electrodes formed within the wells; low density impurity diffused regions respectively interposed between the insulating layers; a first high-density impurity diffused region formed within one low-density impurity diffused region; a second high-density impurity diffused region formed within the other low-density impurity diffused region; interlevel insulating layers formed on the insulating layers and the low-density impurity diffused layers; and metal gate electrodes formed on the low-density impurity diffused layers and the interlevel insulating layers; at least one of the first high-density impurity diffused region and the second high-density impurity diffused region being arranged to overlap an active region, inward from outside edges of the active region.
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申请公布号 |
US5807728(A) |
申请公布日期 |
1998.09.15 |
申请号 |
US19960774824 |
申请日期 |
1996.12.27 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES, CO., LTD. |
发明人 |
JEONG, JAE GOAN;PARK, GUN WOO;KYOUNGKI-DO |
分类号 |
H01L21/331;H01L21/336;H01L21/768;H01L21/822;H01L27/02;H01L27/04;H01L27/06;H01L29/06;H01L29/73;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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