发明名称 Thin film transistor for antistatic circuit and method for fabricating the same
摘要 A thin film transistor for an antistatic circuit includes: wells formed on a silicon substrate; insulating layers for electrical isolation between electrodes formed within the wells; low density impurity diffused regions respectively interposed between the insulating layers; a first high-density impurity diffused region formed within one low-density impurity diffused region; a second high-density impurity diffused region formed within the other low-density impurity diffused region; interlevel insulating layers formed on the insulating layers and the low-density impurity diffused layers; and metal gate electrodes formed on the low-density impurity diffused layers and the interlevel insulating layers; at least one of the first high-density impurity diffused region and the second high-density impurity diffused region being arranged to overlap an active region, inward from outside edges of the active region.
申请公布号 US5807728(A) 申请公布日期 1998.09.15
申请号 US19960774824 申请日期 1996.12.27
申请人 HYUNDAI ELECTRONICS INDUSTRIES, CO., LTD. 发明人 JEONG, JAE GOAN;PARK, GUN WOO;KYOUNGKI-DO
分类号 H01L21/331;H01L21/336;H01L21/768;H01L21/822;H01L27/02;H01L27/04;H01L27/06;H01L29/06;H01L29/73;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/331
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