发明名称 DENSITY DISTRIBUTION MEASURING DEVICE AND METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a device which can measure and display a X-ray projection image of a subject in real time, and to provide a density measuring method which can cope with the change of the measuring condition such as the fluctuation of X-ray tube voltage, and the fluctuation of temperature and humidity. SOLUTION: This measuring device comprises a X-ray generator 5 comprising a microfocus X-ray source, a sample mount 2 on which a samle 1 is to be mounted, a X-ray detector 21 for detecting the X-ray projection image of the sample 1, a computing element 6 for processing the detected data of the X-ray projection image, a display unit 7 for displaying the X-ray projection image or the like, and a recording unit 8, the X-ray is simultaneously projected to two kinds of samples having the densities different from each other, that is, a known sample and an unknown sample, the distribution of the density of the unknown sample is operated on the basis of the detected data of the X-ray projection image, by the computing element 6, and the density distribution is display by the display unit 7 such as CRT or the like.</p>
申请公布号 JPH10227734(A) 申请公布日期 1998.08.25
申请号 JP19970031536 申请日期 1997.02.17
申请人 DAIKEN TRADE & IND CO LTD;HAMAMATSU PHOTONICS KK;SENSOR SYST KK 发明人 AIZAWA HITOSHI;HIRANO MASAYUKI;YANO HIROAKI
分类号 G01N23/04;G01N9/24;(IPC1-7):G01N9/24 主分类号 G01N23/04
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